Condensed Matter Physics, 1999, vol. 2, No. 4(20), p. 661-670, English
DOI:10.5488/CMP.2.4.661

Title: DETERMINING THE GAUSSIAN DISTRIBUTION WIDTH OF CURIE-WEISS TEMPERATURES AND RELAXATION TIMES
Author(s): R.Skulski (University of Silesia, Chair of Materials Science, 2 Sniezna Str., 41-200 Sosnowiec, Poland)

Some new possibilities of determining the gaussian distribution of Curie-Weiss temperatures and relaxation times in relaxors and in ferroelectrics with a diffused phase transition are presented in this paper. The method of determining the width of gaussian distribution of Curie-Weiss temperatures with the use of the reciprocal of dielectric permittivity on normalized plots is applied to solid solution Ba(Ti$_{1-x}$Sn$_x$)O$_3$. The method of estimating the gauss-logarithmic distribution of relaxation times based on normalized plots is proposed for relaxors. It is shown that the Vogel-Fulcher behaviour of real and imaginary parts of the dielectric permittivity in PMN is caused by gauss-logarithmic distribution of relaxation times and by its temperature dependence.

Comments: Figs. 8, Refs. 17, Tabs. 0.


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