Title: Effect of film thickness on the width of percolation threshold in metal-dielectric composites
Author(s):

	M. Mokhtari (Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf, USTO-MB, LEPM, BP 1505, El M' Naouar, 31000 Oran, Algeria; Centre Universitaire de Tissemsilt, BP 182, Tissemsilt, Algeria) ,
	L. Zekri (Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf, USTO-MB, LEPM, BP 1505, El M' Naouar, 31000 Oran, Algeria) ,
	A. Kaiss (Aix Marseille université, CNRS, IUSTI UMR 7343, 13453, Marseille, France) ,
	N. Zekri (Université des Sciences et de la Technologie d'Oran Mohamed Boudiaf, USTO-MB, LEPM, BP 1505, El M' Naouar, 31000 Oran, Algeria)

The effect of thickness on the width of the percolation threshold in metal-dielectric composite films was examined. The distribution of current intensities through cubic networks of metal and dielectric components was determined using Kirchhoff's equations. From the tail of current distribution, the width of the percolation threshold was defined using Lévy statistics, and determined as a function of the film thickness for a system size 100. In the 2D-3D crossover region, the percolation width decreases as a power-law with a power exponent of 0.36±0.01.

Key words: current distribution, percolation, composite materials, resistors network
PACS: 05.10.-a, 02.70.-c, 84.37.+q, 51.70.+f, 83.80.Ab, 78.20.-e

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